Electronic-structure investigation of oxidized aluminum films with electron-momentum spectroscopy

Authors: X. Guo, S. Canney, A. S. Kheifets, M. Vos, Z. Fang, S. Utteridge, I. E. Mccarthy, E. Weigold
DOI: 10.1103/PhysRevB.54.17943
Published: 15 December 1996
Citation Count: 5
Citation Rank: 270941 (out of 593443 papers)
Rescaled PageRank: -0.33
Rescaled PageRank rank: 392065 (out of 593443 papers)